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Tao Yuan

Associate Professor
Industrial and Systems Engineering
Stocker Center 279
yuan@ohio.edu
Phone: 740.593.1547

http://www.ohio.edu/people/yuan/

Tao Yuan joined Ohio University in 2008. Yuan teaches reliability, engineering statistics, engineering probability, operations research, design of experiments, and stochastic processes.


Research Interests: nanomanufacturing, advanced engineering materials, stochastic processes, bayesian statistics

All Degrees Earned: Ph.D., Industrial Engineering, University of Tennessee, 2007; M.E., Industrial Engineering, Texas A&M University, 2004; M.S., Aerospace Engineering, Texas A&M University, 2003; B.E., Thermal Engineering, Tsinghua University, 2000

Publications:

  • T. Yuan and X. Zhu, "Reliability study for ultra-thin gate dielectric considering film thickness variation," IIE Transactions, vol. 44, pp. 744-753, 2012.
  • C.-H. Yang, T. Yuan, W. Kuo, and Y. Kuo, "Nonparametric Bayesian modeling of hazard rate with a change-point for nanoelectronics devices," IIE Transactions, vol. 44, pp. 496-506, 2012.
  • T. Yuan, X. Liu, and W. Kuo, "Planning simple step-stress accelerated life tests using Bayesian methods," IEEE Transactions on Reliability, vol. 61, pp. 254-263, 2012.
  • T. Yuan, S. Ramadan, and S.-J. Bae, "Yield prediction for integrated circuits manufacturing through hierarchical Bayesian modeling of spatial defects," IEEE Transactions on Reliability, vol. 60, pp. 729-741, 2011.
  • T. Yuan, W. Kuo, and S.-J. Bae, "Detection of spatial defect patterns generated in semiconductor fabrication processes," IEEE Transactions on Semiconductor Manufacturing, vol. 24, pp. 392-403, 2011.

Conference Proceeding (10)

  • Yuan, T., Liu, X., Kuo, Y., Zhang, S. (2014). Light Wavelength Effects on Charge Trapping and Detrapping of AIOx Embedded ZrHFO High-K Stack. 2. ECS Transactions; 61: 169-175.
  • Liu, X., Kuo, Y., Yuan, T. (2013). Exposure light wavelength effects on charge trapping and detrapping of nc-MoOx embedded ZrHfO high k stack. Materials Research Society Spring Meeting Proceedings; 1562.
  • Liu, X., Yang, C., Kuo, Y., Yuan, T. (2012). Nanocrystalline MoOx embedded ZrHfO high-k memories - charge trapping and retention characteristics. ECS Transactions; 45.
  • Yuan, T., , . (2011). Bayesian Planning of Optimal Step-Stress Accelerated Life test. Annual Reliability and Maintainability Symposium.
  • Yuan, T. (2011). Nonparametric Bayesian Modeling of Reliability of Nanoelectronic Devices. 2011 NSF Engineering Research and Innovation Conference.
  • Bae, S., Yuan, T. (2010). Reliability Prediction using Beyesian Change-Point Approaches. 4th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling.
  • Kuo, W., Kuo, Y., Yuan, T. (2009). Reliability prediction from nonlinear degradation paths with Bayesian change-point approaches. Proceedings of 2009 NSF Engineering Research and Innovation Conference.
  • Kuo, W., Kuo, Y., Yuan, T. (2008). Detecting spatial defect patterns on semiconductor wafers using model-based clustering. 2008 NSF Engineering Research and Innovation Conference.
  • Yuan, T., Kuo, W. (2007). Bathtub-Shaped Hazard Rate Function for Ultra-thin Gate Dielectrics. 1. Electrochemical Society Transactions - ULSI vs. TFT Conference; 8: 243-248.
  • Kuo, Y., Lu, J., Yan, J., Yuan, T. (2005). Sub 2nm Thick Zirconium Doped Hafnium Oxide High-k Gate Dielectrics. 5. Electrochemical Society Transactions on Physics and Technology of High-k Gate dielectrics III; 1: 447-454.

Journal Article, Professional Journal (5)

  • Yuan, T., Kuo, Y. (2010). Bayesian analysis of hazard rate, change point, and cost-optimal burn-in time for electronic devices. 1. IEEE Transactions on Reliability; 59: 132-138.
  • Yuan, T., Kuo, W. (2008). A Model-Based Clustering Approach to the Recognition of Spatial Defect Patterns Produced During Semiconductor Fabrication. 2. Institute of Industrial Engineers Transactions; 40: 93-101.
  • Yuan, T., Kuo, W. (2008). Spatial defect pattern recognition for semiconductor manufacturing using model-based clustering and Bayesian inference. European Journal of Operational Research; 190: 228-240.
  • Luo, W., Yuan, T., Kuo, Y., Lu, J., Yan, J., Kuo, W. (2006). Charge Trapping and Dielectric Relaxation in Connection wtih Breakdown of High-k Gate Dielectric Stacks. 20. Applied Physics Letters; 88: 202904.
  • Yuan, T., Cizmas, P., O'Brien, T. (2005). A Reduced-Order model for a Bubbling Fluidized Bed Based on Proper Orthogonal Decomposition. Computers and Chemical Engineering; 30: 243-259.

Journal Article, Academic Journal (17)

  • Bae, S., Yuan, T., Ning, S., Kuo, W. (2015). A Bayesian Approach to Modeling Two-phase Degradation using Change-point Regression. Reliability Engineering & System Safety; 124: 66-74.
  • Yuan, T., Yi, J. (2015). A Hierachial Bayesian Degradation Model for Hetergeneous Data. 1. IEEE Transactions on Reliability ; 64: 63-70.
  • Tang, Z., Yuan, T., Tsai, C., Yeh, J., Lundin, C., Liaw, P. (2015). Fatigue Behavior of a wrought Al0.5CoCrCuFeNi Two-Phase High-Entropy Alloy. Acta Materialia; 99: 247-258.
  • Yuan, T., Liu, S., Kuo, Y. (2014). Bayesian Analysis for Accelerated Life Tests using a Dirichlet Process Weibull Mixture Model. 1. IEEE Transactions on Reliability; 63: 58-67.
  • Chuang, C., Yuan, T., Dmowski, W., Wang, G., Freels, M., Liaw, P., Li, R., Zhang, T. (2013). Fatique-induced Damage in Zr-based Bulk Metallic Glasses. 2578. Scientific Reports; 3.
  • Yuan, T., Wang, G., Feng, Q., Liaw, P., Yokoyama, Y., Inoue, A. (2013). Modeling Size Effects on Fatigue Life of a Zirconium-based Bulk-Metallic Glass under Bending. Acta Meterialla; 61: 273-279.
  • Cheng, N., Yuan, T. (2013). Non-parametric Bayesian Lifetime Data Analysis using Dirichlet Process Lognormal Mixture Model. 3. Naval Research Logistics; 60: 208-221.
  • Hemphill, M., Yuan, T., Wang, G., Yeh, J., Tsai, C., Chuang, A., Liaw, P. (2012). Fatigue Behavior of AI0.5CoCrCuFeNi high entropy alloys. 16. Acta Materialia; 60: 5723-5734.
  • , X., Yang, C., Kuo, Y., Yuan, T. (2012). Memory Functions of molybdenum oxide nanodots-embedded ZrHfo high k. 6. ElectroChemical and Solid-State Letters; 15: 192-194.
  • Yang, C., Yuan, T., Kuo, W., Kuo, Y. (2012). Non-parametric Bayesian modeling of hazard rate with a change point for nanoelectronic devices. 7. IIE Transactions; 44: 496-506.
  • Yuan, T., Liu, X., Kuo, W. (2012). Planning Simple step-stress accelerated life tests using Bayesian methods. 1. IEEE Transactions on Reliability; 61: 254-263.
  • Yuan, T., Zhu, X. (2012). Reliability study of ultra-thin dielectric films with variable thickness levels. 9. IIE Transactions; 44: 744-753.
  • Yuan, T. (2011). Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes. IEEE Transactions on Semiconductor Manufacturing; 24: 392-403.
  • Yuan, T., Ramadan, S., Bae, S. (2011). Yield Prediction for Integrated Circuits Manufacturing through Hierarchical Bayesian Modeling of Spatial Defects. IEEE Transactions on Reliability; 60: 729-741.
  • Yuan, T., Bae, S., Park, J. (2010). Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering. International Journal of Advanced Manufacturing Technology; 51: 671-683.
  • Yuan, T. (2009). Construction Project Scheduling with Time, Cost and Material Restrictions Using Fuzzy Mathematical Models and Critical Path Model. Journal of Construction Engineering and Managment; 1096-1104.
  • Luo, W., Yuan, T., Kuo, Y., Lu, J., Yan, J., Kuo, W. (2006). Breakdown Phenomena of Zirconium-Doped Hafnium Oxide High-k Stack with Inserted Interface Layer. 1. Applied Physics Letters; 89: 072901.