Dr. Tao Yuan

Tao Yuan
, Ph.D.
Assistant Professor
Department of Industrial and Systems Engineering
Ohio University

Office: 279 Stocker Center, Athens, OH 45701
Phone: 740 593 1547
Fax:     740 593 0778
Email:  yuan@ohio.edu

Dr. Tao Yuan joined Ohio University as an Assistant Professor in Industrial and Systems Engineering in 2008. His research interests are in quality and reliability issues related to nanoelectronics and advanced engineering materials, applied statistics and stochastic processes, and Bayesian statistics.

Industrial and Information Engineering, University of Tennessee, Knoxville
Industrial and Systems Engineering, Texas A&M University, College Station
Aerospace Engineering, Texas A&M University, College Station
Thermal Engineering, Tsinghua University, Beijing, China

Funded Research Project
  “Collaborative research: nonparametric Bayesian modeling of reliability of nanoelectronics,” sponsored by National Science Foundation. PI: Tao Yuan, $154k, 09/01/2009 – 08/31/2013.

Refereed Journal Publications
T. Yuan, X. Liu, and W. Kuo, “Planning simple step-stress accelerated life tests using Bayesian methods,” IEEE Transactions on Reliability, vol. 61, no. 1, pp. 254-263, Mar. 2012.
T. Yuan and X. Zhu, “Reliability study for ultra-thin gate dielectric considering film thickness variations,” IIE Transactions, vol. 44, pp. 744-753, 2012.
C.-H. Yang, T. Yuan, W. Kuo, and Y. Kuo, “Nonparametric Bayesian modeling of hazard rate with a change-point for nanoelectronics devices,” IIE Transactions, vol. 44, pp. 496-506, 2012.
X. Liu, C.-H. Yang, Y. Kuo, and T. Yuan, “Memory functions of molybdenum oxide nanodots-embedded ZrHfO high-k,” Electrochemical and Solid-State Letters, vol. 15, no. 6, pp. H192-H194, 2012.
M.A. Hemphill, T. Yuan, G.Y. Wang, J.W. Yeh, C.W. Tsai, A. Chuang, and P.K. Liaw, “Fatigue behavior of Al0.5CoCrCuFeNi high entropy alloys,” Acta Materialia, in press, 2012.
T. Yuan, G.Y. Wang, Q. Feng, P.K. Liaw, Y. Yokoyama, and A. Inoue, “Modeling size effects on fatigue life of a zirconium-based bulk-metallic glass under bending,” Acta Materialia, accepted, 2012.
T. Yuan, W. Kuo, and S.-J. Bae, “Detection of spatial defect patterns generated in semiconductor fabrication processes,” IEEE Transactions on Semiconductor Manufacturing, vol. 24, pp. 392-403, 2011.
T. Yuan, S. Ramadan, and S.-J. Bae, “Yield prediction for integrated circuits manufacturing through hierarchical Bayesian modeling of spatial defects,” IEEE Transactions on Reliability, vol. 60, no. 4, pp.729-741, Dec. 2011.
T. Yuan and Y. Kuo, “Bayesian analysis of hazard rate, change point, and cost-optimal burn-in time for electronic devices,” IEEE Transactions on Reliability, vol. 59, no. 1, pp. 132-138, March 2010.
T. Yuan, S.-J. Bae, and J.-I. Park, “Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering,” International Journal of Advanced Manufacturing Technology, vol. 51, pp. 671-683, 2010.
T. Yuan and W. Kuo, “Spatial defect pattern recognition for semiconductor manufacturing using model-based clustering and Bayesian inference,” European Journal of Operational Research, vol. 190, pp. 228-240, 2008.
T. Yuan and W. Kuo, “A model-based clustering approach to the recognition of spatial defect patterns produced during semiconductor fabrication,” IIE Transactions, vol. 40(2), pp. 93-101, 2008.
W. Luo, T. Yuan, Y. Kuo, J. Lu, J. Yan, and W. Kuo, “Breakdown phenomena of zirconium-doped hafnium oxide high-k stack with inserted interface layer,” Applied Physics Letters, 89(7), no. 072901, 2006.
W. Luo, T. Yuan, Y. Kuo, J. Lu, J. Yan, and W. Kuo, “Charge trapping and dielectric relaxation in connection with breakdown of high-k gate dielectric stacks,” Applied Physics Letters, 88(20), no. 202904, 2006.
T. Yuan, P.G. Cizmas, and T. O’Brien, “A reduced-order model for a bubbling fluidized bed based on proper orthogonal decomposition,” Computers and Chemical Engineering, 30, pp. 243-259, 2005.

  Operations research
  Engineering probability
  Engineering statistics
  Stochastic processes
  Design of experiments
  Quality systems