Ohio University

Transmission Electron Microscope 3

Model # of equipment:

JEOL SM-6010PLUS/LA

Brief Description of equipment:

The Russ College provides the JEOL JSM-6010PLUS/LA, which is available for use by interested researchers at Ohio University for characterization of metallic, ceramic, polymeric and composite materials. This instrument includes a microscope for geometric and morphological characterization of conductive and non-conductive samples as well as a spectroscope for elemental analyses and distribution. This instrument is complemented by the Denton Vacuum Desk V for pre-treatment of non-conductive samples prior to characterization.

Capabilities of the equipment:

Transmission Electron Microscope 3 thumbnail
Click image to view detailed PDF flyer.
  • Micro and nano-scale characterization of geometric and chemical distribution in sample
  • Qualitative elemental analyses for atoms larger than lithium via point, linear or areal mapping. Quantitative elemental analyses for atoms larger than oxygen.
  • Low vacuum mode for characterization of non-conducting samples without pre-treatment
  • SEM and EDS conducted within the same software, with the ability to switch from morphological to elemental characterization in seconds.
  • Export results in a variety of formats including .jpeg, .docx and .pptx for handling ease.

Location of equipment:

Stocker Center 409

Procedure for access to the equipment:

Contact Damilola Daramola

Contact person for information or access to the equipment:

Name: Damilola Daramola

Email: daramola@ohio.edu

Training/technical help available?

Yes

Fees for use of equipment?

Yes, $55

scanning electron microscope

Last Updated: 04/14/2021