Scanning Electron Microscope

MODEL # OF EQUIPMENT:

JEOL SM-6010PLUS/LA

BRIEF DESCRIPTION OF EQUIPMENT:

The Russ College provides the JEOL JSM-6010PLUS/LA, which is available for use by interested researchers at Ohio University for characterization of metallic, ceramic, polymeric and composite materials. This instrument includes a microscope for geometric and morphological characterization of conductive and non-conductive samples as well as a spectroscope for elemental analyses and distribution. This instrument is complemented by the Denton Vacuum Desk V for pre-treatment of non-conductive samples prior to characterization.

CAPABILITIES OF THE EQUIPMENT:

• Micro and nano-scale characterization of geometric and chemical distribution in sample
• Qualitative elemental analyses for atoms larger than lithium via point, linear or areal mapping. Quantitative elemental analyses for atoms larger than oxygen.
• Low vacuum mode for characterization of non-conducting samples without pre-treatment
• SEM and EDS conducted within the same software, with the ability to switch from morphological to elemental characterization in seconds.
• Export results in a variety of formats including .jpeg, .docx and .pptx for handling ease.

TRAINING/TECHNICAL HELP AVAILABLE OR REQUIRED TO USE EQUIPMENT?

Yes

FEES FOR USE OF EQUIPMENT?

Yes, $55

Revised 04/25/23