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Research at OHIO

Atomic Force Microscope

Model # of equipment:

Agilent Technologies 5500 AFM

Brief Description of equipment:

Agilent Technologies’ 5500 Atomic Force Microscope is a high-resolution imaging and measurement tool.

Capabilities of the equipment:

Is capable of imaging a sample’s 3-dimensional topography with atomic resolution. Advanced imaging modes including Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), and Phase Imaging allow for the study of various material properties. Both atomic force microscopy and scanning tunneling microscopy can be performed using this instrument.

Location of equipment:

CEER - 182 Mill Street

Procedure for access to the equipment:

Contact CEER.

Contact person for information or access to the equipment:

Name: Yuxuan Wang

Phone: 740.331.4401

Email: ceerfacilities@ohio.edu

Training/technical help available?

Yes.

Fees for use of equipment?

Yes.

Website link for facility/equipment:

http://ceer.dynohio.net/fom/welcome

Last Updated: 01/10/2017