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Tao Yuan

Assistant Professor
Industrial and Systems Engineering
STKR 279
yuan@ohio.edu
Phone: 740.593.1547

http://www.ohio.edu/people/yuan/

Dr. Tao Yuan is an assistant professor in industrial and systems engineering at Ohio University. Yuan joined Ohio University in 2008. Yuan teaches reliability, engineering statistics, engineering probability, operations research, design of experiments, and stochastic processes.


Research Interests: Quality and reliability issues related to nanomanufacturing and advanced engineering materials, applied statistics and stochastic processes, Bayesian statistics

All Degrees Earned: Ph.D., Industrial Engineering, University of Tennessee, Knoxville, 2007. M.E., Industrial Engineering, Texas A&M University, College Station, 2004. M.S., Aerospace Engineering, Texas A&M University, College Station, 2003. B.E., Thermal Engineering, Tsinghua University, China, 2000.

Publications:

[1] T. Yuan and X. Zhu, "Reliability study for ultra-thin gate dielectric considering film thickness variation," IIE Transactions, vol. 44, pp. 744-753, 2012.

[2] C.-H. Yang, T. Yuan, W. Kuo, and Y. Kuo, "Nonparametric Bayesian modeling of hazard rate with a change-point for nanoelectronics devices," IIE Transactions, vol. 44, pp. 496-506, 2012.

[3] T. Yuan, X. Liu, and W. Kuo, "Planning simple step-stress accelerated life tests using Bayesian methods," IEEE Transactions on Reliability, vol. 61, pp. 254-263, 2012.

[4] T. Yuan, S. Ramadan, and S.-J. Bae, "Yield prediction for integrated circuits manufacturing through hierarchical Bayesian modeling of spatial defects," IEEE Transactions on Reliability, vol. 60, pp. 729-741, 2011.

[5] T. Yuan, W. Kuo, and S.-J. Bae, "Detection of spatial defect patterns generated in semiconductor fabrication processes," IEEE Transactions on Semiconductor Manufacturing, vol. 24, pp. 392-403, 2011.