An X-ray diffractometer is a highly sensitive instrument for determining microscopic material structure. X-ray diffraction enables one to determine the structure of materials based on the elastic scattering of X-rays from a sample. The scattering of the X-rays produces a pattern that yields information about the structure of the sample's crystalline lattice. The Ultima IV is a multi-purpose X-ray diffraction instrument which is reliable and dependable. The cross beam optics technology allows the system to be permanently mounted and aligned. This system is designed for high level research performance standards and offers a variety of sample holders.