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X-Ray Diffractometer (XRD)
Rigaku Ultima IV

XRDAn X-ray diffractometer is a highly sensitive instrument for determining microscopic material structure.  X-ray diffraction enables one to determine the structure of materials based on the elastic scattering of X-rays from a sample.  The scattering of the X-rays produces a pattern that yields information about the structure of the sample's crystalline lattice.  The Ultima IV is a multi-purpose X-ray diffraction instrument which is reliable and dependable.  The cross beam optics technology allows the system to be permanently mounted and aligned. This system is designed for high level research performance standards and offers a variety of sample holders.

  • Powder and thin film diffraction
  • Small angle and in-plane scattering
  • Automatic alignment capability
  • User-selectable parallel and focusing geometries
  • Customized electrochemical cell capability
  • For further information, please refer to www.rigaku.com/xrd/ultima.html

Center for Electrochemical Engineering Research
Russ College of Engineering and Technology
165 Stocker Center
Ohio University
Athens, OH 45701
Tel: (740) 593-9670
ceer@ohio.edu

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