Atomic Force Microscope (AFM) / Scanning Tunneling Microscopy (STM)
Agilent Technologies 5500

Atomic force microscopy is a very high-resolution type of scanning probe microscopy with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.  The Agilent 5500 AFM/STM microscope is a state-of-the-art instrument which provides maximum flexibility and modularity due to its unique features, including top-down scanning, precision environmental and temperature control, and unique sample plates.  This microscope offers enhanced atomic resolution suitable for a wide variety of high-tech applications.

• Atomic resolution ideal for electrochemistry, nanolithography, polymers, life sciences, and materials science applications
• Top-down scanning
• Unrivaled environmental and temperature control
• Capable of fluid operations with an open cell
• For further information, please refer to Agilent Technologies 5500 AFM/STM User’s Guide