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Atomic Force Microscope (AFM) / Scanning Tunneling Microscopy (STM)
Agilent Technologies 5500

Atomic Force Microscope

Atomic force microscopy is a very high-resolution type of scanning probe microscopy with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.  The Agilent 5500 AFM/STM microscope is a state-of-the-art instrument which provides maximum flexibility and modularity due to its unique features, including top-down scanning, precision environmental and temperature control, and unique sample plates.  This microscope offers enhanced atomic resolution suitable for a wide variety of high-tech applications.

  • Atomic resolution ideal for electrochemistry, nanolithography, polymers, life sciences, and materials science applications
  • Top-down scanning
  • Unrivaled environmental and temperature control
  • Capable of fluid operations with an open cell
  • For further information, please refer to Agilent Technologies 5500 AFM/STM User’s Guide

Center for Electrochemical Engineering Research
Russ College of Engineering and Technology
165 Stocker Center
Ohio University
Athens, OH 45701
Tel: (740) 593-9670
ceer@ohio.edu

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